Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5521522 | Probe apparatus for testing multiple integrated circuit dies | Yuichi Abe, Masao Yamaguchi | 1996-05-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5521522 | Probe apparatus for testing multiple integrated circuit dies | Yuichi Abe, Masao Yamaguchi | 1996-05-28 |