Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8140500 | Spectral measurement with assisted data analysis | Jerome J. Workman, Jr., Stephen R. Lowry, Nicholas Simon Nunn | 2012-03-20 |
| 7496220 | Spectroscopic microscopy with image-driven analysis | Federico Izzia, Alexander Grenov | 2009-02-24 |