Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6731388 | Method of measuring surface plasmon resonance using interference structure of reflected beam profile | Robert T. Deck, Richard V. Andaloro | 2004-05-04 |
| 5846843 | Sensor using long range surface plasmon resonance with diffraction double-grating | — | 1998-12-08 |