Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5703361 | Circuit scanning device and method | — | 1997-12-30 |
| 5414265 | Line-width measurements of metallization coated with insulator on microelectronic circuits using energy dispersive x-ray analysis | — | 1995-05-09 |
| H993 | Thin film thickness mapping technique | — | 1991-11-05 |
| H589 | Measurement of film thickness of integrated circuits | — | 1989-02-07 |
| 4777364 | Defect detection and thickness mapping of the passivation layer(s) of integrated circuits | — | 1988-10-11 |