Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10551423 | System and method for simultaneous testing of radiation, environmental and electrical reliability of multiple semiconductor electrical devices | Kevin Geoghegan, Tom Shepherd | 2020-02-04 |
| 10175266 | Wafer level electrical probe system with multiple wavelength and intensity illumination capability system | Ajit Sandhu, Joe Liu | 2019-01-08 |