Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7194907 | Method for measuring part thickness having an external coating using impedance matching delay lines | Paul Joseph DeAngelo, Steven Abe LaBreck | 2007-03-27 |
| 6393384 | Apparatus and method for remote ultrasonic determination of thin material properties using signal correlation | Brian W. Anthony, Petros Kotidis, Daniel E. Klimek | 2002-05-21 |
| 6198097 | Photocharge microscope | Julius Frankel, Pankaj K. Das | 2001-03-06 |
| 5929338 | Thickness measurement of in-ground culverts | Julius Frankel, Stephan Schroeder | 1999-07-27 |
| 5747693 | System for taking transverse measurements | Julius Frankel, Mark Doxbeck | 1998-05-05 |
| 5557970 | Automated thickness measurement system | Julius Frankel, Mark Doxbeck | 1996-09-24 |
| 5463896 | Stress tester | Julius Frankel, Wilfried Scholz, Vito J. Colangelo, William Korman | 1995-11-07 |