Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5838005 | Use of focused ion and electron beams for fabricating a sensor on a probe tip used for scanning multiprobe microscopy and the like | Arunava Majumdar, Ke Luo | 1998-11-17 |
| 5581083 | Method for fabricating a sensor on a probe tip used for atomic force microscopy and the like | Arunava Majumdar, Ke Luo | 1996-12-03 |