Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6291820 | Highly charged ion secondary ion mass spectroscopy | Alex V. Hamza, Thomas Schenkel, Dieter Schneider | 2001-09-18 |
| 6288394 | Highly charged ion based time of flight emission microscope | Thomas Schenkel, Alex V. Hamza, Dieter Schneider, Barney L. Doyle | 2001-09-11 |