Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6493420 | Apparatus and method for in-situ measurement of residual surface stresses | — | 2002-12-10 |
| 5414747 | Method and apparatus for in-process analysis of polycrystalline films and coatings by x-ray diffraction | Mark E. Jacobs | 1995-05-09 |
| 5148458 | Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction | — | 1992-09-15 |
| 4686631 | Method for determining internal stresses in polycrystalline solids | — | 1987-08-11 |