Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7180317 | High resolution analytical probe station | — | 2007-02-20 |
| 7043848 | Method and apparatus for maintaining accurate positioning between a probe and a DUT | Stephen W. Schmidt | 2006-05-16 |
| 6917195 | Wafer probe station | — | 2005-07-12 |
| 6838895 | High resolution analytical probe station | — | 2005-01-04 |
| 6803756 | Wafer probe station | Daniel Harrison | 2004-10-12 |
| 6744268 | High resolution analytical probe station | — | 2004-06-01 |
| 6700397 | Triaxial probe assembly | Robert D. Hancock, Daniel E. Smith | 2004-03-02 |
| 6621282 | High resolution analytical probe station | — | 2003-09-16 |
| 6424141 | Wafer probe station | Daniel Harrison | 2002-07-23 |
| 6198299 | High Resolution analytical probe station | — | 2001-03-06 |
| 6191598 | High resolution analytical probe station | — | 2001-02-20 |
| 5783835 | Probing with backside emission microscopy | Hans E. Karlsson | 1998-07-21 |
| 4956923 | Probe assembly including touchdown sensor | James T. Pettingell | 1990-09-18 |
| 4893914 | Test station | Robert D. Hancock, Gene A. Porter | 1990-01-16 |
| 4607220 | Method and apparatus for low temperature testing of electronic components | — | 1986-08-19 |
| 4466746 | Ebulliometric hot spot detector | Robert D. Hancock | 1984-08-21 |