Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4405861 | Secondary-electron detector for analyzing irradiated samples for scanning electron microscopes and microprobes | Giancarlo Giacchetti, Jurgen Ransch | 1983-09-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4405861 | Secondary-electron detector for analyzing irradiated samples for scanning electron microscopes and microprobes | Giancarlo Giacchetti, Jurgen Ransch | 1983-09-20 |