Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11971451 | Method for determining parameters in on-wafer calibration piece model | Aihua Wu, Yibang Wang, Faguo Liang, Chen Liu, Peng Luan +2 more | 2024-04-30 |
| 11733298 | Two-port on-wafer calibration piece circuit model and method for determining parameters | Yibang Wang, Aihua Wu, Faguo Liang, Chen Liu, Peng Luan +2 more | 2023-08-22 |
| 11385175 | Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter | Yibang Wang, Aihua Wu, Faguo Liang, Chen Liu, Peng Luan +2 more | 2022-07-12 |
| 11275103 | Calibration method, system and device of on-wafer s parameter of vector network analyzer | Yibang Wang, Aihua Wu, Faguo Liang, Chen Liu, Xuefeng Zou +2 more | 2022-03-15 |