Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7745768 | Absolute target system enhanced by combining a star sensor and a formation flight optical metrological sensor | Xavier Leyre | 2010-06-29 |
| 7561262 | Lateral and longitudinal metrology system | Cyril Degrelle, Xavier Leyre, Suzanne Abadie | 2009-07-14 |