Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11119137 | Electrical test structure and method for monitoring deep trench impedance to substrate | Neil Gardner | 2021-09-14 |
| 10879106 | Apparatus with overlapping deep trench and shallow trench and method of fabricating the same with low defect density | — | 2020-12-29 |
| 9793364 | Substrate contact having substantially straight sidewalls to a top surface of the substrate | David William Hamann, Abbas Ali | 2017-10-17 |
| 9460962 | Substrate contact etch process | David William Hamann, Abbas Ali | 2016-10-04 |
| 8258041 | Method of fabricating metal-bearing integrated circuit structures having low defect density | Srinivas Raghavan, Kalyan Cherukuri, Richard Allen Faust | 2012-09-04 |