RM

Robert A. McGowan

TI Texas Instruments: 23 patents #489 of 12,488Top 4%
FS Freeescale Semiconductor: 4 patents #779 of 3,767Top 25%
NB Nxp B.V.: 3 patents #771 of 3,591Top 25%
NU Nxp Usa: 2 patents #735 of 2,066Top 40%
CI Communications & Power Industries: 1 patents #20 of 55Top 40%
Daimlerchrysler Ag: 1 patents #1,774 of 4,854Top 40%
Overall (All Time): #96,535 of 4,157,543Top 3%
35
Patents All Time

Issued Patents All Time

Showing 25 most recent of 35 patents

Patent #TitleCo-InventorsDate
12355586 Scalable virtualized controller area network system Arun Kumar Barman, Pradeep Singh, Rahul Agrawal, Devendra Singh 2025-07-08
12314192 Multiple level SoC resource allocation and isolation system and method 2025-05-27
11755361 Freedom from interference for aggregated communication channel handling using event-based processor extensions Brian C. Kahne, Michael A. Fischer 2023-09-12
10048314 Scan path only one-bit scan register when component not selected Gary L. Swoboda 2018-08-14
9903912 Status register between test data I/O of scan port SUT Gary L. Swoboda 2018-02-27
9626279 Debug method and device for providing indexed trace messages Robert N. Ehrlich 2017-04-18
9626280 Debug method and device for handling exceptions and interrupts Robert N. Ehrlich, Michael Brian SCHINZLER 2017-04-18
9612283 Blocking the effects of scan chain testing upon a change in scan chain topology Gary L. Swoboda 2017-04-04
9495169 Predicate trace compression Robert N. Ehrlich, Petru Lauric 2016-11-15
9395413 Blocking the effects of scan chain testing upon a change in scan chain topology Gary L. Swoboda 2016-07-19
9304880 System and method for multicore processing Michael L. Olivarez, Stephen J. Benzel, Robert N. Ehrlich 2016-04-05
9285426 Blocking the effects of scan chain testing upon a change in scan chain topology Gary L. Swoboda 2016-03-15
9157958 Blocking the effects of scan chain testing upon a change in scan chain topology Gary L. Swoboda 2015-10-13
9063197 Blocking the effects of scan chain testing upon a change in scan chain topology Gary L. Swoboda 2015-06-23
8938651 Blocking the effects of scan chain testing upon a change in scan chain topology Gary L. Swoboda 2015-01-20
8666690 Heterogeneous multi-core integrated circuit and method for debugging same Amar Nath Deogharia, Robert N. Ehrlich 2014-03-04
8656234 Test port connected to master output of override selection logic Gary L. Swoboda 2014-02-18
8572323 Cache result register for quick cache information lookup Robert N. Ehrlich, Kevin C. Heuer 2013-10-29
8464111 Select, override and master override controlling multiplexing TDI and TDO Gary L. Swoboda 2013-06-11
8359502 TDI multiplexer gating controlled by override selection logic Gary L. Swoboda 2013-01-22
8261143 Select signal and component override signal controlling multiplexing TDI/TDO Gary L. Swoboda 2012-09-04
8181067 Apparatus and method for test and debug of a processor/core having advanced power management 2012-05-15
7890316 Synchronizing on-chip data processor trace and timing information for export Gary L. Swoboda 2011-02-15
7676698 Apparatus and method for coupling a plurality of test access ports to external test and debug facility 2010-03-09
7558984 Apparatus and method for test and debug of a processor/core having advanced power management 2009-07-07