Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7624322 | Scan based testing of an integrated circuit containing circuit portions operable in different clock domains during functional mode | Bipin Duggal | 2009-11-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7624322 | Scan based testing of an integrated circuit containing circuit portions operable in different clock domains during functional mode | Bipin Duggal | 2009-11-24 |