Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6393602 | Method of a comprehensive sequential analysis of the yield losses of semiconductor wafers | Ron Ross | 2002-05-21 |
| 6324481 | Method for the calculation of wafer probe yield limits from in-line defect monitor data | Ron Ross | 2001-11-27 |
| 6210983 | Method for analyzing probe yield sensitivities to IC design | Ron Ross | 2001-04-03 |