Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6839600 | Project organization and dissemination system for machine programming and control systems | Kenneth V. Spenser, Michael Schoonmaker, James B. Behm, Kurudi Muralidhar, Andrew H. McMillan | 2005-01-04 |
| 6754540 | Flowchart-based control system including external functions | Michael McFarland, James Alan Steenstra, James B. Behm, Joseph Gasiorek, Kurudi Muralidhar +1 more | 2004-06-22 |
| 6118448 | Control program tracking and display system | Andrew H. McMillan, Brent Allen Bartson, James Alan Steenstra | 2000-09-12 |
| 5926176 | Control program tracking and display system | Andrew H. McMillan, Brent Allen Bartson, James Alan Steenstra | 1999-07-20 |
| 5159700 | Substrate with optical communication systems between chips mounted thereon and monolithic integration of optical I/O on silicon substrates | Han-Tzong Yuan | 1992-10-27 |
| 5009476 | Semiconductor layer with optical communication between chips disposed therein | Han-Tzong Yuan | 1991-04-23 |
| 4954458 | Method of forming a three dimensional integrated circuit structure | — | 1990-09-04 |
| 4951370 | Method of making an intelligent multiprobe tip | — | 1990-08-28 |
| 4888550 | Intelligent multiprobe tip | — | 1989-12-19 |
| 4761681 | Method for fabricating a semiconductor contact and interconnect structure using orientation dependent etching and thermomigration | — | 1988-08-02 |
| 4754316 | Solid state interconnection system for three dimensional integrated circuit structures | — | 1988-06-28 |
| 4660066 | Structure for packaging focal plane imagers and signal processing circuits | — | 1987-04-21 |
| 4585991 | Solid state multiprobe testing apparatus | Tommy D. Cody | 1986-04-29 |
| 4572886 | Optical method for integrated circuit bar identification | — | 1986-02-25 |
| 4535424 | Solid state three dimensional semiconductor memory array | — | 1985-08-13 |
| 4338950 | System and method for sensing and measuring heart beat | Carl A. Barlow, Jr. | 1982-07-13 |
| 4219771 | Four-quadrant, multiprobe-edge sensor for semiconductor wafer probing | Charles R. Ratliff | 1980-08-26 |
| 4195259 | Multiprobe test system and method of using same | Charles R. Ratliff | 1980-03-25 |