Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8693271 | Method of stressing static random access memories for pass transistor defects | Beena Pious, Stanton Petree Ashburn, James Craig Ondrusek | 2014-04-08 |
| 8526253 | Method of screening static random access memories for pass transistor defects | Beena Pious, Wah Kit Loh, Stanton Petree Ashburn | 2013-09-03 |
| 7450452 | Method to identify or screen VMIN drift on memory cells during burn-in or operation | Juan A. Rosal, Michael Allen Ball, Anand Krishnan | 2008-11-11 |