Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7323899 | System and method for resumed probing of a wafer | Glenn Schuette, Curtis Miller | 2008-01-29 |
| 7148716 | System and method for the probing of a wafer | Glenn Schuette, Curtis Miller | 2006-12-12 |
| 5422892 | Integrated circuit test arrangement and method for maximizing the use of tester comparator circuitry to economically test wide data I/O memory devices | Francis Hii, Inderjit Singh | 1995-06-06 |