Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7958408 | On-chip receiver sensitivity test mechanism | Dirk Leipold, Oren E. Eliezer, Ran Katz, Bogdan Staszewski | 2011-06-07 |
| 7813462 | Method of defining semiconductor fabrication process utilizing transistor inverter delay period | Robert Bogdan Staszewski, Dirk Leipold | 2010-10-12 |
| 7254755 | On-chip receiver sensitivity test mechanism | Dirk Leipold, Oren E. Eliezer, Ran Katz, Bogdan Staszewski | 2007-08-07 |
| 7035750 | On-chip test mechanism for transceiver power amplifier and oscillator frequency | Chih-Ming Hung, Dirk Leipold, Oren E. Eliezer | 2006-04-25 |