CE

Christopher J. Ellingham

TI Texas Instruments: 2 patents #5,248 of 12,488Top 45%
Overall (All Time): #2,250,854 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5923836 Testing integrated circuit designs on a computer simulation using modified serialized scan patterns Phillip T. Barch, Frederick L. Wagner, John R. Larkin 1999-07-13
5574853 Testing integrated circuit designs on a computer simulation using modified serialized scan patterns Phillip T. Barch, Frederick L. Wagner, John R. Larkin 1996-11-12