ST

Su-Wei Tsai

TR Test Research: 5 patents #3 of 31Top 10%
Overall (All Time): #1,010,659 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8843357 Electrical connection defect simulation test method and system of the same Ming-Hsien Liu 2014-09-23
8350575 Electrical connection defect detection system and method Shang-Tsang Yeh 2013-01-08
8324908 Electrical connection defect detection device Shang-Tsang Yeh 2012-12-04
7855567 Electronic device testing system and method Hsin-Hao Chen 2010-12-21
7702982 Electronic device testing system and method Chia-Ming Chen 2010-04-20