ET

Eric Paul Tabor

TA Test Advantage: 7 patents #1 of 9Top 15%
Overall (All Time): #578,106 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8417477 Methods and apparatus for local outlier detection Emilio Miguelanez, Jacky Gorin 2013-04-09
8041541 Methods and apparatus for data analysis Paul Buxton, Emilio Miguelanez Martin, Ali M. S. Zalzala 2011-10-18
8000928 Methods and apparatus for data analysis Michael J. Scott, Jacky Gorin, Paul Buxton 2011-08-16
7437271 Methods and apparatus for data analysis 2008-10-14
7395170 Methods and apparatus for data analysis Michael J. Scott, Jacky Gorin, Paul Buxton 2008-07-01
7225107 Methods and apparatus for data analysis Paul Buxton, Emilio Miguelanez Martin, Ali M. S. Zalzala 2007-05-29
7167811 Methods and apparatus for data analysis 2007-01-23
6792373 Methods and apparatus for semiconductor testing 2004-09-14
6782297 Methods and apparatus for data smoothing 2004-08-24