Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10629412 | Apparatus with two or more particle beams for processing a specimen | Tomas Hrncir | 2020-04-21 |
| 10535496 | Device with ion column and scanning electron microscope | Jaroslav Jiruse | 2020-01-14 |
| 10504694 | Scanning electron microscope and method of use thereof | Jaroslav Jiruse, Milos Havelka, Jan Polster, Josef Rysavka, Martin Zadrazil | 2019-12-10 |
| 10109457 | Method of specimen processing in an apparatus with two or more particle beams and apparatus for this processing | Tomas Hrncir | 2018-10-23 |
| 8729471 | Electron detector including an intimately-coupled scintillator-photomultiplier combination, and electron microscope and X-ray detector employing same | Nicholas C. Barbi, Claudio Piemonte, Richard B. Mott | 2014-05-20 |
| 7193222 | Secondary electron detector, especially in a scanning electron microscope | Marcus Jacka, Martin Zadrazil | 2007-03-20 |