Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392820 | Test system with adjustable delay line and radiation feedback control | Darius Sullivan, Simon Chandler | 2025-08-19 |
| 12332297 | Test system | — | 2025-06-17 |
| 11921154 | Test system | Darius Sullivan, Simon Chandler | 2024-03-05 |
| 11726136 | Test system | — | 2023-08-15 |
| 11366158 | Test system for testing the integrity of an electronic device | Darius Sullivan, Simon Chandler | 2022-06-21 |
| 11169202 | Test system | — | 2021-11-09 |
| 10076261 | Imaging apparatus and method | Donald Dominic Arnone, Craig Ciesla | 2018-09-18 |
| 10006960 | Test system | — | 2018-06-26 |
| 9829433 | Imaging techniques and associated apparatus | Philip F. Taday, Anthony James Fitzgerald | 2017-11-28 |
| 9075002 | TeraHertz probe array imaging system | Simon Chandler | 2015-07-07 |
| 9006660 | Scanning terahertz probe | Vincent Patrick Wallace, Michael Withers, John Baker, Brian G. Robertson | 2015-04-14 |
| 8665423 | Method and apparatus for investigating a non-planar sample | Michael Withers | 2014-03-04 |
| 7728296 | Spectroscopy apparatus and associated technique | Michael Charles Kemp, William R. Tribe, Philip F. Taday | 2010-06-01 |
| 7485863 | Method and apparatus for investigating a sample | — | 2009-02-03 |
| 7397428 | Coherent THz emitter with DC power reducing resistor | Michael John Evans, Julian Alexander Cluff | 2008-07-08 |
| 7335883 | Imaging apparatus and method | Vincent Patrick Wallace, Ruth Mary Woodward, Donald Dominic Arnone | 2008-02-26 |
| 7315175 | Probe apparatus and method for examining a sample | — | 2008-01-01 |
| 7214940 | Apparatus and method for investigating a sample | Julian Alexander Cluff, Donald Dominic Arnone | 2007-05-08 |
| 7174037 | Imaging apparatus and method | Donald Dominic Arnone, Craig Ciesla | 2007-02-06 |
| 7152007 | Imaging apparatus and method | Donald Dominic Arnone, Craig Ciesla, Stefano Barbieri | 2006-12-19 |
| 6865014 | Apparatus and method for investigating a sample | Craig Ciesla, Donald Dominic Arnone | 2005-03-08 |