Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6360340 | Memory tester with data compression | Benjamin J. Brown, Robert Gage, Alexander Joffe | 2002-03-19 |
| 5923675 | Semiconductor tester for testing devices with embedded memory | Benjamin J. Brown, Kurt B. Gusinow | 1999-07-13 |