Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11067629 | Automated test equipment for testing high-power electronic components | — | 2021-07-20 |
| 11041900 | Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer level | — | 2021-06-22 |
| 10698020 | Current regulation for accurate and low-cost voltage measurements at the wafer level | — | 2020-06-30 |
| 9989584 | Controlling signal path inductance in automatic test equipment | Steven Price, David R. Hanna, Jeffry Baenen, Scott Skibinski | 2018-06-05 |
| 7561083 | Testing of analog to digital converters | David L. Anderson | 2009-07-14 |
| 6759842 | Interface adapter for automatic test systems | — | 2004-07-06 |
| 6697753 | Methods and apparatus for testing electronic devices | Gordon M. Samuelson | 2004-02-24 |