Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4899055 | Thin film thickness measuring method | — | 1990-02-06 |
| 4844617 | Confocal measuring microscope with automatic focusing | Herman F. Kelderman, Michael E. Fein, Alan E. Loh, Armand P. Neukermans | 1989-07-04 |
| 4719028 | Thermal energy storage media | Timothy W. James | 1988-01-12 |