MM

Michael Meyer

Ericsson: 103 patents #90 of 9,909Top 1%
VI Visiongate: 12 patents #2 of 26Top 8%
BS Briggs & Stratton: 10 patents #51 of 490Top 15%
OT Optis Wireless Technology: 6 patents #21 of 120Top 20%
Rolls-Royce Plc: 6 patents #139 of 1,164Top 15%
NE Neopath: 5 patents #10 of 35Top 30%
OT Optis Cellular Technology: 5 patents #17 of 129Top 15%
RA Rolls-Royce North America: 5 patents #111 of 447Top 25%
UP Unwired Planet: 4 patents #7 of 154Top 5%
TI Tripath Imaging: 4 patents #8 of 36Top 25%
UW University Of Washington: 1 patents #985 of 2,234Top 45%
IH Idtp Holdings: 1 patents #21 of 32Top 70%
📍 Phoenix, AZ: #11 of 6,660 inventorsTop 1%
🗺 Arizona: #56 of 32,909 inventorsTop 1%
Overall (All Time): #5,434 of 4,157,543Top 1%
159
Patents All Time

Issued Patents All Time

Showing 151–159 of 159 patents

Patent #TitleCo-InventorsDate
6453060 Method and apparatus for deriving separate images from multiple chromogens in a branched image analysis system James K. Riley, David Perry, Andrew David Silber 2002-09-17
6198839 Dynamic control and decision making method and apparatus Chih-Chau L. Kuan, Shih-Jong J. Lee, Seho Oh, Wendy R. Bannister 2001-03-06
6137899 Apparatus for the identification of free-lying cells Shih-Jong J. Lee, Paul S. Wilhelm, Wendy R. Bannister, Chih-Chau L. Kuan, Seho Oh 2000-10-24
6134354 Apparatus for the identification of free-lying cells Shih-Jong J. Lee, Paul S. Wilhelm, Wendy R. Bannister, Chih-Chau L. Kuan, Seho Oh 2000-10-17
5987158 Apparatus for automated identification of thick cell groupings on a biological specimen Shih-Jong J. Lee, Paul S. Wilhelm 1999-11-16
5978497 Apparatus for the identification of free-lying cells Shih-Jong J. Lee, Paul S. Wilhelm, Wendy R. Bannister, Chih-Chau L. Kuan, Seho Oh 1999-11-02
5933519 Cytological slide scoring apparatus Shih-Jong J. Lee, Paul S. Wilhelm, Wendy R. Bannister, Chih-Chau L. Kuan, William E. Ortyn +3 more 1999-08-03
5828776 Apparatus for identification and integration of multiple cell patterns Shih-Jong J. Lee, Chih-Chau L. Kuan, Wendy R. Bannister, Paul S. Wilhelm 1998-10-27
5745601 Robustness of classification measurement apparatus and method Shih-Jong J. Lee, Chih-Chau L. Kuan, Paul S. Wilhelm 1998-04-28