JP

John J. Pickerd

Tektronix: 60 patents #2 of 1,698Top 1%
TE Tektronic: 1 patents #1 of 12Top 9%
📍 Hillsboro, OR: #44 of 2,365 inventorsTop 2%
🗺 Oregon: #503 of 28,073 inventorsTop 2%
Overall (All Time): #37,533 of 4,157,543Top 1%
61
Patents All Time

Issued Patents All Time

Showing 26–50 of 61 patents

Patent #TitleCo-InventorsDate
9772391 Method for probe equalization William A. Hagerup, William Q. Law 2017-09-26
9599639 Device and method to prevent inter-system interference 2017-03-21
9432042 Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing Daniel G. Knierim 2016-08-30
9407280 Harmonic time domain interleave to extend arbitrary waveform generator bandwidth and sample rate 2016-08-02
9140723 Signal acquisition probe storing compressed or compressed and filtered time domain impulse or step response data for use in a signal measurement system Richard A. Booman 2015-09-22
8928514 Harmonic time domain interleave to extend oscilloscope bandwidth and sample rate 2015-01-06
8891603 Re-sampling S-parameters for serial data link analysis Kan Tan 2014-11-18
8788234 Method of calibrating interleaved digitizer channels 2014-07-22
8650010 Apparatus and method for generating a test signal with emulated crosstalk Parthasarathy Raju M, Sampathkumar R. Desai 2014-02-11
8588703 Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication Kan Tan 2013-11-19
8542002 System and method for performing power spectral density and power level measurements P E Ramesh 2013-09-24
8463224 Arbitrary multiband overlay mixer apparatus and method for bandwidth multiplication Kan Tan 2013-06-11
8233569 Realtime spectrum trigger system on realtime oscilloscope Kan Tan 2012-07-31
7474972 Bandwidth multiplication for a test and measurement instrument using non-periodic functions for mixing Kan Tan, Thomas Casey Hill 2009-01-06
7460983 Signal analysis system and calibration method Kan Tan, William A. Hagerup, Rolf Anderson, Sharon M. Mc Masters 2008-12-02
7414411 Signal analysis system and calibration method for multiple signal probes Kan Tan 2008-08-19
7408363 Signal analysis system and calibration method for processing acquires signal samples with an arbitrary load Kan Tan 2008-08-05
7405575 Signal analysis system and calibration method for measuring the impedance of a device under test Kan Tan, Ping Qiu 2008-07-29
7298206 Multi-band amplifier for test and measurement instruments Thomas F. Lenihan 2007-11-20
7271575 Oscilloscope based return loss analyzer Laudie J. Doubrava 2007-09-18
7257497 Sequential frequency band acquisition apparatus for test and measurement instruments 2007-08-14
7254498 Method and apparatus for providing bandwidth extension and channel match for oscilloscopes Marvin E. La Voie, Rolf Anderson 2007-08-07
7206722 Oscilloscope having an enhancement filter Kan Tan 2007-04-17
7155355 Method of constraints control for oscilloscope vertical subsection and display parameters 2006-12-26
7098839 Flash array digitizer 2006-08-29