MR

Matthias Ruther

TW Technische Universität Wien: 1 patents #75 of 329Top 25%
Overall (All Time): #3,075,017 of 4,157,543Top 75%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9161014 Estimation of defocused reflectance maps for the robust determination of “shape from focus” in microscopic images Manfred Prantl, Stefan Scherer, Martin Lenz, Horst Bischof 2015-10-13