Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11009523 | Probe, inspection jig, and inspection apparatus | Minoru Kato, Tadakazu Miyatake, Akio Hayashi, Matthias Joseph Chin Chieh Chia, Cheng Ghee Ong +1 more | 2021-05-18 |
| 9101075 | Substrate with built-in component | Kazuaki IDA, Tatsuro Sawatari, Hiroshi Nakamura | 2015-08-04 |
| 9007782 | Substrate with built-in electronic component | Tatsuro Sawatari, Yuichi Sugiyama, Hiroshi Nakamura, Tetsuo Saji | 2015-04-14 |
| 8923009 | Substrate with built-in electronic component | Tatsuro Sawatari, Yuichi Sugiyama, Hiroshi Nakamura, Tetsuo Saji | 2014-12-30 |
| 6249186 | High-frequency power amplifier circuit and high-frequency power amplifier module | Hitoshi Ebihara, Masanobu Kaneko, Fumitaka Iizuka | 2001-06-19 |