Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8193824 | Monitoring plasma induced damage during semiconductor wafer processes | Ji-Shyang Nieh | 2012-06-05 |
WW
Wu-Der Weng
Overall (All Time): #3,210,146 of 4,157,543Top 80%
1
Patents All Time