Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405359 | Target measurement device and method for measuring a target | Che-Hui Lee, Chih-Cheng Wei, Wen-Cheng Yang, Chyi-Tsong Ni | 2025-09-02 |
| 12387923 | Analyzing method | Che-Hui Lee, Wen-Cheng Yang | 2025-08-12 |
| 11754691 | Target measurement device and method for measuring a target | Che-Hui Lee, Chih-Cheng Wei, Wen-Cheng Yang, Chyi-Tsong Ni | 2023-09-12 |
| 11747131 | Measuring method and semiconductor structure forming method | Che-Hui Lee | 2023-09-05 |
| 11532470 | Analyzing method | Che-Hui Lee, Wen-Cheng Yang | 2022-12-20 |
| 11460290 | Measuring method and semiconductor structure forming method | Che-Hui Lee | 2022-10-04 |