Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12216412 | Frequency-picked methodology for diffraction-based overlay measurement | Hung-Chih Hsieh | 2025-02-04 |
| 11852981 | Frequency-picked methodology for diffraction based overlay measurement | Hung-Chih Hsieh | 2023-12-26 |