Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9703919 | System and method of filtering actual defects from defect information for a wafer | Tsung-Hsien Lee | 2017-07-11 |
| 9057965 | Method of generating a set of defect candidates for wafer | Tsung-Hsien Lee | 2015-06-16 |