Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11726465 | Method for detecting environmental parameter in semiconductor fabrication facility | Yi Yang, Chia-Lin Hsu | 2023-08-15 |
| 11493909 | Method for detecting environmental parameter in semiconductor fabrication facility | Yi Yang, Chia-Lin Hsu | 2022-11-08 |