Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6005385 | Test board circuit for detecting tester malfunction and protecting devices under test | — | 1999-12-21 |
| 5752771 | Integrated circuit module fixing mechanism for temperature cycling test | Jin-Yuan Lee | 1998-05-19 |
| 5659245 | ESD bypass and EMI shielding trace design in burn-in board | Jian-Hsing Lee | 1997-08-19 |
| 5610081 | Integrated circuit module fixing method for temperature cycling test | Jin-Yuan Lee | 1997-03-11 |