Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11676959 | Electrostatic discharge protection circuit | Ming-Fu Tsai, Tzu-Heng Chang, Yu-Ti Su | 2023-06-13 |
| 11404409 | Electrostatic discharge protection circuit | Ming-Fu Tsai, Tzu-Heng Chang, Yu-Ti Su | 2022-08-02 |
| 11387150 | Fabricating method of decreasing height difference of STI | Hui-Min Chen, Song Gu, Wen Yi Tan | 2022-07-12 |
| 10840237 | Electrostatic discharge protection circuit | Ming-Fu Tsai, Tzu-Heng Chang, Yu-Ti Su | 2020-11-17 |
| 8666140 | Defect inspection method for wafer and wafer defect inspection system using the same | — | 2014-03-04 |
| 7899635 | Sampling inspection method | Sung-Lin Tsai, Michael Kian Ann Wee, Boon-Wah Chong | 2011-03-01 |