Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10141413 | Wafer strength by control of uniformity of edge bulk micro defects | Pu Chen, Ting-Chun Wang | 2018-11-27 |
| 9064823 | Method for qualifying a semiconductor wafer for subsequent processing | Pu Chen, Ting-Chun Wang | 2015-06-23 |