Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385967 | Wafer test system and methods | Jyu-Hua Hsiao, Chun Lin, Kam Heng Lee, Jiun-Rong Pai | 2025-08-12 |
| 12326463 | Probe card needle shape and method of manufacturing | Ting-Yu Chiu, Yi-Neng Chang, Wen-Chun Tu, Te-Kun Lin | 2025-06-10 |
| 12241929 | Work press assembly for test handler | Yi-Neng Chang, Ting-Yu Chiu, Shin-Han You | 2025-03-04 |
| 11099234 | False detection method for loading probe card | Chia-Wei Wang, Wei Yang | 2021-08-24 |