Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11211297 | Method for testing bridging in adjacent semiconductor devices and test structure | Meng-Han Lin, Chih-Ren Hsieh | 2021-12-28 |
| 10734292 | Method for testing bridging in adjacent semiconductor devices and test structure | Meng-Han Lin, Chih-Ren Hsieh | 2020-08-04 |
| 10276458 | Method for testing bridging in adjacent semiconductor devices and test structure | Meng-Han Lin, Chih-Ren Hsieh | 2019-04-30 |