Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7760930 | Translation engine of defect pattern recognition | Chih-Cheng Chou, Chih-Hung Wu, Chia-Hua Chang | 2010-07-20 |
| 7386418 | Yield analysis method | Chih-Hung Wu, Mei-Yen Li | 2008-06-10 |
| 6225226 | Method for processing and integrating copper interconnects | Fu-Sheng Lee, Chien-Chen Chen, Cheh-Chieh Lu | 2001-05-01 |