Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6426285 | Method to solve intermetallic dielectric cracks in integrated circuit devices | Chin-Tsai Chen | 2002-07-30 |
| 6242312 | Advanced titanium silicide process for very narrow polysilicon lines | Yuan-Chang Huang, Ding Hu, Hong-Che Hsiue | 2001-06-05 |