Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283626 | Semiconductor device | — | 2025-04-22 |
| 12154979 | Dynamically doped field-effect transistor and a method for controlling such | — | 2024-11-26 |
| 11894451 | Semiconductor device | — | 2024-02-06 |
| 11688771 | Method for manufacturing semiconductor device | — | 2023-06-27 |
| 11264452 | Hetero-tunnel field-effect transistor (TFET) having a tunnel barrier formed directly above channel region, directly below first source/drain region and adjacent gate electrode | — | 2022-03-01 |
| 11024729 | Method for manufacturing semiconductor device | — | 2021-06-01 |
| 11018226 | Semiconductor device and manufacturing method thereof | — | 2021-05-25 |
| 10896974 | Method of fabricating semiconductor device | — | 2021-01-19 |
| 10861962 | Semiconductor device and method of fabricating the same | — | 2020-12-08 |
| 10541303 | Nanowire FinFET Transistor | Blandine Duriez, Mark van Dal | 2020-01-21 |
| 10483380 | Semiconductor device and method of manufacturing the same | — | 2019-11-19 |
| 10475908 | Semiconductor device and method of fabricating the same | — | 2019-11-12 |
| 10276566 | Leakage current suppression methods and related structures | — | 2019-04-30 |
| 10269944 | Fin semiconductor device and method of manufacture with source/drain regions having opposite conductivities | Blandine Duriez | 2019-04-23 |
| 10008567 | Nanowire FinFet transistor | Blandine Duriez, Mark van Dal | 2018-06-26 |
| 9818744 | Leakage current suppression methods and related structures | — | 2017-11-14 |
| 9685528 | Fin semiconductor device and method of manufacture with source/drain regions having opposite conductivities | Blandine Duriez | 2017-06-20 |
| 9679968 | Field effect transistors and methods of forming same | Blandine Duriez, Mark van Dal | 2017-06-13 |
| 9472468 | Nanowire CMOS structure and formation methods | Mark van Dal, Gerben Doornbos | 2016-10-18 |
| 9349860 | Field effect transistors and methods of forming same | Blandine Duriez, Mark van Dal | 2016-05-24 |