Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7693667 | Method and system for determining a predicted flash endurance Vt of a flash cell after N program/erase cycles | — | 2010-04-06 |
| 7394280 | Method of electro migration testing | Yong Han Frankie Low, Kwang Ye Sim | 2008-07-01 |