Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8309027 | Specimen preparation apparatus, specimen preparation/analysis system and specimen plate | Masanori Nakaya, Yoshihiro Hyousa, Eisuke Kobayashi, Hideyuki Higuchi | 2012-11-13 |
| 8221683 | Specimen preparation apparatus, specimen preparation/analysis system and specimen plate | Masanori Nakaya, Yoshihiro Hyousa, Eisuke Kobayashi, Hideyuki Higuchi | 2012-07-17 |
| 6172568 | Power amplifier | — | 2001-01-09 |
| 5391988 | Method and apparatus for detecting flaws within a conductive object while cancelling the effects of variation in distance between the detection apparatus and the conductive object | — | 1995-02-21 |