Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10763870 | Digital fractional clock synthesizer with period modulation | Rhona Wade | 2020-09-01 |
| 8243033 | Position sensor | David Ely, Geoffrey Foote, Gareth John McCaughan | 2012-08-14 |
| 7948245 | Methods and systems for detecting a capacitance using sigma-delta measurement techniques | Kirk Hargreaves, Joseph Kurth Reynolds, David Ely | 2011-05-24 |
| 7902842 | Methods and systems for switched charge transfer capacitance measuring using shared components | Joseph Kurth Reynolds, Kirk Hargreaves, David Ely, Paul Routley | 2011-03-08 |
| 7750649 | Methods and systems for detecting a capacitance using switched charge transfer techniques | David Ely, Paul Routley, Joseph Kurth Reynolds, Kirk Hargreaves | 2010-07-06 |
| 7683641 | Methods and systems for detecting a capacitance using sigma-delta measurement techniques | Kirk Hargreaves, Joseph Kurth Reynolds, David Ely | 2010-03-23 |
| 7521941 | Methods and systems for detecting a capacitance using switched charge transfer techniques | David Ely, Paul Routley, Joseph Kurth Reynolds, Kirk Hargreaves | 2009-04-21 |
| 7511705 | Position sensor | Christopher J. Silk, David Ely, Andrew M. Errington, Ian Collins, Geoffrey Foote +2 more | 2009-03-31 |
| 7453270 | Methods and systems for detecting a capacitance using sigma-delta measurement techniques | Kirk Hargreaves, Joseph Kurth Reynolds, David Ely | 2008-11-18 |
| 7449895 | Methods and systems for detecting a capacitance using switched charge transfer techniques | David Ely, Paul Routley, Joseph Kurth Reynolds, Kirk Hargreaves | 2008-11-11 |
| 7423437 | Methods and systems for detecting a capacitance using sigma-delta measurement techniques | Kirk Hargreaves, Joseph Kurth Reynolds, David Ely | 2008-09-09 |
| 7301350 | Methods and systems for detecting a capacitance using sigma-delta measurement techniques | Kirk Hargreaves, Joseph Kurth Reynolds, David Ely | 2007-11-27 |
| 7288946 | Methods and systems for detecting a capacitance using sigma-delta measurement techniques | Kirk Hargreaves, Joseph Kurth Reynolds, David Ely | 2007-10-30 |