Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6791347 | Probe apparatus applicable to a wafer level burn-in screening | Masaaki Ishizaka | 2004-09-14 |
YN
Yumio Nakamura
Overall (All Time): #3,490,163 of 4,157,543Top 85%
1
Patents All Time